Particle analysis closer to the process.
IC-PARTICLE™ provides particle-size information in emulsions, dispersions and slurries using a compact optical measurement platform — from benchtop analysis toward continuous process monitoring.
IC-PARTICLE™ provides particle-size information in emulsions, dispersions and slurries using a compact optical measurement platform — from benchtop analysis toward continuous process monitoring.
Move particle information beyond occasional offline laboratory analysis.
A compact optical architecture designed for more frequent particle measurements, without the complexity of a traditional laboratory particle analyzer.
Direct, flow-through or controlled-dilution configurations can be selected according to sample concentration and application.
Across 90 prepared dairy-emulsion samples, IC-PARTICLE™ D[5,3] fat-globule size measurements showed strong agreement with a Malvern Mastersizer 3000 laser-diffraction reference.
Diluted milk samples, measured using the benchtop-format configuration — not a claim of direct, undiluted, online milk measurement.
Undiluted measurement where concentration and optical conditions allow.
Extends the usable measurement range for more concentrated particle systems.
For applications where only very small sample volumes are available.
Direct measurement can avoid changes introduced by dilution — such as shifts in particle interactions, aggregation state or apparent particle-size distribution — where the particle system and concentration allow.
Bringing particle measurements closer to the process can enable higher-frequency information than traditional offline sampling workflows.
A compact optical platform also opens possibilities for particle monitoring at more measurement points and at lower system complexity.
Benchtop and Online systems available during 2027 — configurations of the same optical platform, selected per application.
IC-PARTICLE™ uses particle-dependent optical scattering to extract particle and droplet information from complex liquid systems.
Explore the technology →Measurement configuration is selected according to the particle system, concentration and application.
Performance depends on particle system, concentration and measurement configuration. Request the full specification for details.
Send us samples and we can evaluate the measurement potential.
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