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IC-PARTICLE™

Particle analysis closer to the process.

IC-PARTICLE™ provides particle-size information in emulsions, dispersions and slurries using a compact optical measurement platform — from benchtop analysis toward continuous process monitoring.

EMULSIONS · DISPERSIONS · SLURRIES
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IC-PARTICLE™ benchtop particle analyzer
Shown: IC-PARTICLE™ Benchtop — Online render in development
In development · 2027
Jump toWhat it measuresWhy IC-PARTICLEResultBenchtop → processSpecs
— What can it measure?

Emulsions. Dispersions. Slurries.

— Why IC-PARTICLE™

Particle information, without the lab bottleneck.

Closer to the process

Move particle information beyond occasional offline laboratory analysis.

Compact measurement

A compact optical architecture designed for more frequent particle measurements, without the complexity of a traditional laboratory particle analyzer.

Flexible sample handling

Direct, flow-through or controlled-dilution configurations can be selected according to sample concentration and application.

— Demonstrated result

Strong agreement with laser diffraction.

Across 90 prepared dairy-emulsion samples, IC-PARTICLE™ D[5,3] fat-globule size measurements showed strong agreement with a Malvern Mastersizer 3000 laser-diffraction reference.

Demonstrated
R = 0.978
Agreement with Malvern Mastersizer 3000
90 prepared dairy-emulsion samples
See the dairy-emulsion case →

Diluted milk samples, measured using the benchtop-format configuration — not a claim of direct, undiluted, online milk measurement.

— From benchtop toward process

From benchtop toward process measurement.

BenchtopFlow-through / Online

Direct flow-through

Undiluted measurement where concentration and optical conditions allow.

Controlled dilution

Extends the usable measurement range for more concentrated particle systems.

Microflow

For applications where only very small sample volumes are available.

Measure closer to the native sample state.

Direct measurement can avoid changes introduced by dilution — such as shifts in particle interactions, aggregation state or apparent particle-size distribution — where the particle system and concentration allow.

Bringing particle measurements closer to the process can enable higher-frequency information than traditional offline sampling workflows.

A compact optical platform also opens possibilities for particle monitoring at more measurement points and at lower system complexity.

Benchtop and Online systems available during 2027 — configurations of the same optical platform, selected per application.

— Technology

Built on patented Spec-Imaging technology.

IC-PARTICLE™ uses particle-dependent optical scattering to extract particle and droplet information from complex liquid systems.

Explore the technology →
— Specification

IC-PARTICLE™ at a glance.

View full specification

Measurement configuration is selected according to the particle system, concentration and application.

 IC-PARTICLE™ BenchtopIC-PARTICLE™ Online
MeasurementParticle / droplet sizingContinuous particle / droplet sizing
Current demonstrated range80 nm – 30 µmApplication dependent
Sample formatCuvette · flow cell · micro-flowFlow cell
Sample conditioningDirect / application dependentDirect or controlled dilution
Typical useR&D · QC · at-lineContinuous process monitoring
CommunicationPoE / IC-PARTICLE™ ControlPoE / IC-PARTICLE™ Control
Availability20272027

Performance depends on particle system, concentration and measurement configuration. Request the full specification for details.

Have an emulsion, dispersion or slurry?

Send us samples and we can evaluate the measurement potential.

Discuss your application